X-ray Reflectometry: Principles and Analytical applications

November 19, 2014 by M. Tiwari
X-ray Reflectometry: Principles and Analytical applications
Joint ICTP-IAEA School on Novel Experimental Methodologies for Synchrotron Radiation Applications in Nano-science and Environmental Monitoring | (smr 2611)
Speaker(s): M. Tiwari
Location: LB (Euler Lecture Hall)
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